Testing Static Random Access Memories: Defects, Fault Models and Test Patterns (Frontiers in Electronic Testing)
| タイトル | Testing Static Random Access Memories: Defects, Fault Models and Test Patterns (Frontiers in Electronic Testing) |
| 発売日 | 販売日未定 |
| 製作者 | Said Hamdioui |
| 販売元 | Springer |
| JANｺｰﾄﾞ | 9781402077524 |
| カテゴリ | » 洋書 » By Publisher » Springer |